Technik
vor 18 StundenKI-Zusammenfassung
China Achieves Breakthrough in Wafer Polishing with First Integrated Six-Inch Metrology System
Chinese company Hwatsing develops the country's first integrated six-inch metrology system for wafer polishing, enhancing efficiency in chip manufacturing despite ongoing reliance on foreign suppliers for complex procedures.
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SCMP Economy2 Min. Lesezeit